PXIE-4082 NI 6位300 V板载1.8 MS/s隔离式数字多用表

PXIE-4082

The National Instruments PXIe-4082 (Part Number: 783131-01) is a 6½-Digit, ±300 V, Onboard 1.8 MS/s Isolated Digital Multimeter. This Multimeter provides the typical measurement capabilities found in a high-resolution DMM and a digitizer. As a DMM, the NI PXIe‑4082 delivers speedy, precise AC/DC voltage, AC/DC current, 2‑ or 4‑wire resistance, and frequency/period measurements, and diode tests. In the high-voltage, isolated digitizer mode, the PXIe‑4082 can acquire waveforms at sample rates of 1.8 MS/s maximum. The device has a frequency range of 15 Hz to 500 kHz.

The NI PXIe‑4082 features a 10 to 23-bit versatile resolution, voltage measurements up to 300 VDC (300 Vrms), current measurements up to 1 A, resistance measurements up to 100 MΩ, and basic capacitance and inductance measurement capabilities. It has a power consumption of +12 V load at 0.55 A maximum, and +3.3 V load at 0.55 A max.

For the isolated digitizer, the voltage of the National Instruments PXIe‑4082 PXI Digital Multimeter ranges from ±100 mV to ±300 V (DC or AC coupled), the current ranges from ±20 mA to ±1 A, and the sample rate range is 10 S/s to 1.8 MS/s. The front panel of the device has 4 shrouded banana plug connectors.

The NI PXIe-4082 PXI Digital Multimeter has a recommended operating temperature range of 0 0C to 55 0 C, a storage ambient temperature range of -40 °C to 71 °C, a relative humidity range of 10% to 90% (noncondensing) in an operating environment, and a maximum altitude is 2,000 m (800mbar) at 25 °C ambient temperature. The NI device weighs 12 oz, and measures 8.5 x 0.8 x 5.1 in. in physical dimensions. It has operating and non-operating random vibrations of 0.3 grms and 2.4 grms respectively – all at a frequency range of 5 Hz to 500 Hz.

The PXIe-4082 has a recommended warm-up time of 60 minutes to rated accuracy, and should be calibrated externally at least once In 2 years. It is run using the NI-DMM 15.2 or later driver software which is compatible with software packages or application development environments (ADEs) such as LabVIEW, LabWindows/CVI, or Measurement Studio.