PXIE-4142 PXI源测量装置 782430-01

National Instruments PXIe-4142 PXI Source Measure Unit

The PXIe-4142 (Part Number: 782430-01) has an ideal SMU response that shields the gadget under test from undesirable transients, while accomplishing the speediest conceivable testing times and elimination of framework dependability issues because of motions. The capacity to accomplish an ideal reaction for any load implies that these SMUs with SourceAdapt innovation are perfect for testing gadgets. The NI PXIe-4142 has a semiconductor test program that must communicate data from the instrumentation of the analyzer to the DUT to which the instrumentation is associated. To deal with this communication in a test program, test engineers must think about the accompanying prerequisites for instrument sessions and channels for all resources in the test framework:

·         Create test program code that uses the names of current associations on the DUT (DUT pins) to allude to channels on the instrument.

·         Deal with a substantial number of instrument channels.

·         Scale test code to test multiple sites in parallel to enhance tester proficiency.

·         Support multiple kinds of instruments since diverse instruments may utilize channels and sessions in different ways.

Regularly, instrument driver programming provides test engineers with software apparatuses for communicating with the DUT in terms of the instrument channels and sessions. Be that as it may, instrument drivers have no data about the current pins on the DUT. To create test code that uses DUT pin names, to test engineers must use to pi map to relate each DUT pin name with the name, channel, and session of the instrument associated with that specific DUT pin.