PXIe-5172 784224-01 高密度示波器

NI PXIe-5172(部件编号:784224-01,784225-01,784226-01)高密度示波器使用Measurement and Automation Explorer (MAX)配置National Instruments硬件。MAX通知其他程序哪些小工具驻留在框架中以及它们是如何排列的。随后介绍了仪器设计库和NI-SCOPE驱动软件。PXIe-5172模块在工厂远程对准。但是，在下列情况下，用户应该执行自校准:

•首次在底盘中引入NI PXIe-5172后。

•安装、卸载、移动机箱模块后。

•当框架处于周围温度变化或模块温度偏离最后一次自动校准温度超过±5°C的域时。

•定期调整随着物品老化而发生的小产量漂移。

为了使其小型化、适应性强、功能强大的设计成为可能，PXIe-5172示波器采用了创新的先进技术，包括利用快速串行接口JESD204B的低控制、高分辨率adc，用于信息交换和精英、低成本的赛灵思活力利用。在许多测试框架中，用户应该通过计算机信号控制被测设备或被测芯片。传统的自动化测试框架可以对测试模式进行排序，并在每个阶段执行必要的步骤。现在，自动测试设备(ATE)框架根据所接收到的评估系统，结合智能在DUT设置之间进展。

PXIE-5172

The NI PXIe-5172 (Part Numbers: 784224-01, 784225-01, 784226-01) High-Density Oscilloscope uses Measurement and Automation Explorer (MAX) to configure the National Instruments hardware. MAX informs other programs about what gadgets reside in the framework and how they are arranged. MAX is consequently introduced with the instrument design libraries and NI-SCOPE driver software. The PXIe-5172 module is remotely aligned at the factory. However, the user should perform a self-alignment in any of the accompanying circumstances:

• After introducing the NI PXIe-5172 for the first time in its chassis.

• After installing, uninstalling, or moving any frame module.

• When the framework is in a domain where the encompassing temperature shifts or the temperature of the module has digressed more than ± 5 ° C from the temperature in the last auto-calibration.

• Adjust periodically for small yield drifts that happen with the aging of the item.

To empower its minimized, adaptable, and powerful design, the PXIe-5172 Oscilloscope exploits innovative advances, including low-control, high-resolution ADCs utilizing the fast serial interface JESD204B for information exchange and elite, low-cost Xilinx vitality utilization.  In numerous test frameworks, the user should control the DUT or chip under test through computerized signals. Conventional automated test frameworks can sequence through the DUT modes and make the necessary steps at each stage. Now and again, automated test equipment (ATE) frameworks incorporate intelligence to progress between the DUT settings according to the estimation esteems received.